4H-N Type & Semi-Insulating Silicon Carbide (SiC) Substrates, 2–8 Inch Wafers for Power Devices, RF & Epitaxy Applications

The 4H-N type and Semi-Insulating (SI) Silicon Carbide (SiC) substrates are high-performance single-crystal wafers engineered for next-generation power electronics, RF devices, and epitaxial applications. Manufactured using the advanced Physical Vapor Transport (PVT) method, these substrates offer exceptional material purity (≥99.9995%), low defect density, and superior structural consistency.

The 4H-N type and Semi-Insulating (SI) Silicon Carbide (SiC) substrates are high-performance single-crystal wafers engineered for next-generation power electronics, RF devices, and epitaxial applications. Manufactured using the advanced Physical Vapor Transport (PVT) method, these substrates offer exceptional material purity (≥99.9995%), low defect density, and superior structural consistency.

As a representative material of wide bandgap semiconductors, 4H-SiC delivers outstanding high-voltage tolerance, high-frequency performance, and thermal stability, making it an essential platform for modern semiconductor devices.

  • 4H-N type substrates are optimized for power device fabrication such as MOSFETs and Schottky diodes
  • Semi-insulating substrates are ideal for RF and microwave applications, including GaN epitaxy and high-frequency circuits

Key Features

1. Superior Electrical Performance

  • 4H-N Type Resistivity: 0.015–0.028 Ω·cm
  • Semi-Insulating Resistivity: ≥10⁵ Ω·cm
  • Wide bandgap (~3.26 eV) supports high breakdown voltage (3–5 MV/cm)
  • Enables low switching loss and high efficiency in power devices

2. Excellent Thermal & Mechanical Properties

  • Thermal conductivity up to ~4.5 W/cm·K
  • Operates reliably in temperatures above 600°C
  • High hardness (~Mohs 9.2), ensuring durability during processing

3. High-Precision Geometric Control

  • Total Thickness Variation (TTV): ≤ 15 µm
  • Bow: ≤ 25 µm
  • Warp: ≤ 5 µm
  • Ensures excellent compatibility with epitaxial growth and lithography processes

4. Controlled Crystal Orientation

  • On-axis orientation: < ±0.5°
  • Off-axis orientation: 4° ±0.5° toward <11-20>
  • Optimized for epitaxial layer uniformity and defect suppression

5. Advanced Surface Quality

  • Standard polished surface: Ra ≤ 1 nm
  • CMP surface: Ra ≤ 0.5 nm (epi-ready)
  • Low micropipe density:
    • Zero-grade: ≤ 1 cm⁻²
    • Production-grade: ≤ 5 cm⁻²

Applications

Power Electronics

  • SiC MOSFETs
  • Schottky Barrier Diodes (SBD)
  • IGBTs
    Widely used in electric vehicles, industrial inverters, and energy systems

RF & Microwave Devices

  • High-frequency amplifiers
  • MMICs (Monolithic Microwave Integrated Circuits)
  •  Especially suited for 5G, radar, and satellite communications

Optoelectronics

  • GaN-based LEDs and laser diodes
  • UV photonic devices

High-Temperature & Harsh Environments

  • Aerospace electronics
  • Automotive sensors
  • Energy and oil & gas applications

Manufacturing Process Highlights

  • PVT Crystal Growth: Ensures high-purity and stable 4H polytype
  • Diamond Wire Slicing: Precision wafer thickness control
  • Lapping & Grinding: Improves flatness and removes subsurface damage
  • CMP Polishing: Produces ultra-smooth epi-ready surfaces
  • Strict Quality Inspection: Includes resistivity mapping, defect density, and geometry verification

Technical Specifications

Parameter Specification
Material SiC Single Crystal
Type 4H-N / Semi-Insulating
Diameter 2, 3, 4, 6, 8 inch
Purity ≥ 99.9995%
Resistivity N-type: 0.015–0.028 Ω·cm / SI: ≥10⁵ Ω·cm
Thickness 330–500 µm (customizable)
TTV ≤ 15 µm
Bow ≤ 25 µm
Warp ≤ 5 µm
Surface Roughness Ra ≤ 0.5 nm (CMP)
Orientation On-axis / 4° off-axis
Packaging Single wafer box / 25pcs cassette

Customization Options

We offer full customization to meet different device and process requirements:

  • Wafer size: 2″ to 8″
  • Thickness adjustment
  • Orientation control (on-axis / off-axis)
  • Surface finish (DSP / CMP / epi-ready)
  • Resistivity & doping tuning
  • Special coatings or epitaxial services

Industry Value

In the SiC industry chain, substrates form the foundation of device performance. High-quality substrates directly determine epitaxial layer quality, device yield, and long-term reliability.

Our 4H-SiC wafers are widely used as base materials for epitaxial growth (CVD) and advanced device fabrication, supporting the rapid development of EVs, renewable energy systems, and high-frequency communication technologies.

FAQs

Q1: What is the difference between 4H-N and Semi-Insulating SiC?
A: 4H-N is conductive and used for power devices, while semi-insulating SiC is used for RF and microwave applications due to its high resistivity.

Q2: Are the wafers epi-ready?
A: Yes, CMP-polished wafers are epi-ready and suitable for direct epitaxial growth.

Q3: Can I customize specifications?
A: Yes, we support full customization including size, thickness, resistivity, and orientation.

Q4: What quality documents are provided?
A: Each wafer comes with a test report, including resistivity mapping, TTV, and defect inspection data.

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